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A new X-ray spectroscopic tool
Artist impression of X-rays from a far-away source (top right) intercepted by an interstellar dust particle (yellow square), in which emittance and absorption of electrons between neighboring atoms causes a sinusoidal behavior in the observed X-ray spectrum. (lower left). Top right shows a drawing of the XMM satellite.
EXAFS is a powerful tool for studying the structure of grains in the interstellar medium (ISM). It is based on the phenomenon that X-ray photons can eject electrons from atoms inside solid particles, which in turn can be backscattered onto the emitting atom by atoms in their immediate neighborhood. This causes characteristic sinusoidal absorption features in the X-ray spectrum of a distant source that depend on the structure of the absorbing solid material. Another, perhaps better known, technique of probing ISM dust, infrared spectroscopy, can also be used to study crystalline dust. However, EXAFS has a major advantage over infrared spectroscopy, in that it can probe the solid matter along the line-of-sight at the level of the atomic structure, even for irregular amorphous materials. Infrared spectroscopy, by comparison, provides information at the mineralogical level. As a result, using EXAFS, astronomers can obtain a very detailed sampling of the composition and atomic structure of the dust along the line-of-sight. EXAFS gives a more detailed picture of the chemical composition and atomic structure of amorphous grains than is possible with infrared spectroscopy. Posted by: Sean Source |
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